Technical Information
Electrical Fast Transient Immunity Testing of Electronic and Electrical Equipment in Industrial Envi
[ 12-17-2024 ]
The electrical fast transient immunity test of electronic and electrical equipment in industrial environments is mainly carried out in accordance with the national standard GB/T17626.4 or the international standard IEC61000-4-4. The following are the specific test methods:
1. Test purpose
Evaluate the performance and stability of electronic and electrical equipment when subjected to electrical fast transient pulse group interference to ensure the reliable operation of the equipment in industrial and commercial environments.
2. Test equipment
EFT/B generator: used to generate fast electrical transient pulse groups, capable of setting pulse amplitude, frequency, and period.
Coupling/decoupling network (CDN): used to couple the pulse group to the power line or signal line while isolating other equipment.
Electrical isolation transformer: used to protect test equipment and other sensitive equipment from high voltage.
Oscilloscope: used to monitor and record the response of the device under test during the test.
3. Test setting
Test environment: carried out in an environment with good electromagnetic shielding to avoid external electromagnetic interference affecting the test results.
Test bench setting: The equipment under test (EUT) should be placed on an insulated tabletop, 0.8 meters above the ground or at a height as required by specific requirements.
Connect CDN: Connect the EFT/B generator to the power line or signal line of the device under test through CDN.
Use an isolation transformer to protect other devices and test equipment.
IV. Test parameters
Pulse amplitude: Set the pulse voltage according to the working voltage and anti-interference requirements of the device, such as 500V, 1kV, 2kV, etc.
Pulse frequency: The typical pulse frequency is 5kHz or 100kHz, and other frequencies can also be set as needed.
Pulse width: The duration of each pulse is usually between 50 nanoseconds and 100 nanoseconds.
Pulse group duration: The duration of each group of pulse groups is usually 15 milliseconds, with an interval of 300 milliseconds.
V. Test steps
Initial functional test: Verify the device's normal function and performance baseline before applying EFT/B.
Gradual application: Start from the lowest pulse voltage and gradually increase to the target voltage while observing the device's response.
Check response: Monitor the functional performance of the device and any abnormal phenomena such as restart, data loss, or communication interruption during the pulse application process.
Real-time monitoring: Use an oscilloscope or other monitoring equipment to record the behavior and output signals of the device during the test in real-time.
Abnormal record: record the device response at each pulse amplitude and frequency, including any failure or performance degradation.
Function recovery: after the test, check whether the device can be restored to normal operation.
VI. Test result analysis
Problem diagnosis: for devices that show abnormalities under certain conditions, analyze their causes, such as grounding problems, insufficient shielding, etc.
Improvement suggestions: make suggestions to improve the device's anti-interference ability based on the test results, such as adding filters, using ferrite cores to absorb interference, etc.
VII. Precautions
Ground wire problem: ensure that the ground wire connection between the device and the test equipment is good to avoid test abnormalities caused by poor ground wire.
Insufficient shielding: improve the shielding of the device housing and signal lines to improve anti-interference ability.
Sensitive circuit protection: protect the circuit parts sensitive to EFT/B by adding filters or isolators.
In short, electrical fast transient pulse group immunity detection is an important test to ensure the reliable operation of electronic and electrical equipment in industrial environments. By strictly implementing the test process and analyzing the test results, the anti-interference ability of the equipment can be effectively improved to ensure its stability and reliability in practical applications.
1. Test purpose
Evaluate the performance and stability of electronic and electrical equipment when subjected to electrical fast transient pulse group interference to ensure the reliable operation of the equipment in industrial and commercial environments.
2. Test equipment
EFT/B generator: used to generate fast electrical transient pulse groups, capable of setting pulse amplitude, frequency, and period.
Coupling/decoupling network (CDN): used to couple the pulse group to the power line or signal line while isolating other equipment.
Electrical isolation transformer: used to protect test equipment and other sensitive equipment from high voltage.
Oscilloscope: used to monitor and record the response of the device under test during the test.
3. Test setting
Test environment: carried out in an environment with good electromagnetic shielding to avoid external electromagnetic interference affecting the test results.
Test bench setting: The equipment under test (EUT) should be placed on an insulated tabletop, 0.8 meters above the ground or at a height as required by specific requirements.
Connect CDN: Connect the EFT/B generator to the power line or signal line of the device under test through CDN.
Use an isolation transformer to protect other devices and test equipment.
IV. Test parameters
Pulse amplitude: Set the pulse voltage according to the working voltage and anti-interference requirements of the device, such as 500V, 1kV, 2kV, etc.
Pulse frequency: The typical pulse frequency is 5kHz or 100kHz, and other frequencies can also be set as needed.
Pulse width: The duration of each pulse is usually between 50 nanoseconds and 100 nanoseconds.
Pulse group duration: The duration of each group of pulse groups is usually 15 milliseconds, with an interval of 300 milliseconds.
V. Test steps
Initial functional test: Verify the device's normal function and performance baseline before applying EFT/B.
Gradual application: Start from the lowest pulse voltage and gradually increase to the target voltage while observing the device's response.
Check response: Monitor the functional performance of the device and any abnormal phenomena such as restart, data loss, or communication interruption during the pulse application process.
Real-time monitoring: Use an oscilloscope or other monitoring equipment to record the behavior and output signals of the device during the test in real-time.
Abnormal record: record the device response at each pulse amplitude and frequency, including any failure or performance degradation.
Function recovery: after the test, check whether the device can be restored to normal operation.
VI. Test result analysis
Problem diagnosis: for devices that show abnormalities under certain conditions, analyze their causes, such as grounding problems, insufficient shielding, etc.
Improvement suggestions: make suggestions to improve the device's anti-interference ability based on the test results, such as adding filters, using ferrite cores to absorb interference, etc.
VII. Precautions
Ground wire problem: ensure that the ground wire connection between the device and the test equipment is good to avoid test abnormalities caused by poor ground wire.
Insufficient shielding: improve the shielding of the device housing and signal lines to improve anti-interference ability.
Sensitive circuit protection: protect the circuit parts sensitive to EFT/B by adding filters or isolators.
In short, electrical fast transient pulse group immunity detection is an important test to ensure the reliable operation of electronic and electrical equipment in industrial environments. By strictly implementing the test process and analyzing the test results, the anti-interference ability of the equipment can be effectively improved to ensure its stability and reliability in practical applications.