Scope of Test Method 1 for Semiconductor Integrated Circuit Analog Switches: This standard specifies the parameter testing methods for bipolar, MOS, junction type field-effect semiconductor integrated circuit analog switches (hereinafter referred to as devices). This standard is applicable to semiconductor integrated circuit analog switches and also to the testing of multiplexer parameters. The following normative references are essential for the application of this document. For dated references, only the dated version applies to this document. For undated references, the latest version (including all modification orders) applies to this document. GB/T 17940-2000 Semiconductor Devices - Integrated Circuits - Part 3: Analog Integrated Circuits
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