The electrical fast transient pulse group immunity test complies with the IEC61000-4-4 GB/T17626.4 standard [1] 1.1. In the circuit causing the electrical fast transient pulse group, such as switching transient processes (cutting off inductive loads, relay contacts popping, etc.), it usually causes interference to other electrical and electronic equipment in the same circuit. The key points of the experiment are the high amplitude, short rise time, high repetition rate, and low energy of the transient. The purpose of the 1.2 Electrical Fast Transient Pulse Group Immunity Test is to determine a common reproducible evaluation basis for evaluating the performance of the power supply ports, signal, control, and grounding ports of electrical and electronic equipment under electrical fast transient (pulse group) interference. 1.3 Electrical fast transient pulse group immunity test level 1.4 Test configuration: The grounding reference plane should be a metal plate (copper or aluminum) with a minimum thickness of 0.25 mm, or other metal materials can be used, but their minimum thickness should be 0.65 mm. The minimum size of the grounding reference plane is 1 meter × 1 m, the actual size is related to the size of the test object, and the periphery of the reference grounding plate should be at least 0.1m larger than the geometric projection size on each side of the test object. Note: The reference grounding plate must be connected to the protective grounding. When using coupling clamps, the minimum distance between the coupling plate and all other conductive structures is 0.5m, except for the grounding reference plane below the coupling clamp. Unless otherwise specified in other product standards or product class standards, the length of the signal and power lines between the coupling device and the tested equipment should be 0.5m ± 0.05m. The test object should be placed on a ground reference plane and separated from it by an insulation support with a thickness of 0.1m ± 0.01. If the test device is a desktop device, it should be located 0.8m ± 0.08m above the ground plane. The minimum distance between the test object and all other conductive structures (such as the walls of the shielding room) is greater than 0.5m. If the length of the power cable provided by the manufacturer that is not detachable from the equipment exceeds 0.5m ± 0.05m, the excess length of the cable should be folded to avoid forming a flat ring and placed 0.1m above the grounding reference plane. The climatic conditions of the laboratory should be within the normal operating range of the equipment specified by the respective manufacturers of the EUT and testing instruments. If the relative humidity is high enough to cause condensation on the EUT and testing instruments, the test should not be conducted. 1.6 Electrical Fast Transient Group Pulse Immunity Test Results: a) Normal performance within the limits specified by the manufacturer, principal, or purchaser; b) Temporary loss or degradation of function or performance, but capable of self recovery after disturbance stops, without the need for operator intervention; c) Temporarily losing or reducing function or performance, but requiring operator intervention to restore; d) Unrecoverable functional loss or performance degradation caused by device hardware or software damage, or data loss