This standard specifies the methods and general procedures for conducting failure analysis of semiconductor discrete devices in the laboratory
Scope of Application
This standard is applicable to the failure analysis of semiconductor discrete devices (hereinafter referred to as devices)
Application Guide
When conducting failure analysis, the failure analysis method and program to be used should be determined based on factors such as the type, structure, failure mode, and failure mechanism of the failed device.
. The failure analysis program provided in this standard allows analysts to conduct failure analysis work based on it, and they can also modify the analysis program appropriately according to actual work conditions to achieve the analysis purposeReference
GJB 128A-97 Test Methods for Discrete Semiconductor Devices
GJB 360A-96 Test Methods for Electronic and Electrical Components
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