Scope
This standard specifies the testing methods for radiometry, photometry, colorimetry, electrical, thermal parameters, and electromagnetic compatibility of semiconductor light-emitting diodes (hereinafter referred to as devices) This standard is applicable to visible light and white light semiconductor light-emitting diodes. The testing of ultraviolet emitting diodes, infrared emitting diodes, semiconductor light-emitting components, and chips can be referred to and executed
Normative reference documents
The clauses in the following documents become the clauses of this standard through reference.
. For dated reference documents, subsequent amendments (excluding corrected content) or revisions do not apply to this standard. However, parties to agreements based on this standard are encouraged to study whether the latest versions of these documents can be used. For undated references, the latest version applies to this standard CB/T 3977-20011 Color Representation Method (CIE No.15 2-1986, MOD)GB/T 4365-2003? Electrotechnical terminology Electromagnetic compatibility (IEC 60050 (161): 1990, IDT)
GB/T 5698-2001/Color terminology
GB/T 5702-2003 Methods for evaluating the color rendering of light sources
GB/T 7921-1997; Uniform Color Space and Color Difference Formula (CIE No.15 2-1986, NEQ)
GB/T 7922-2003 Measurement Methods for Color of Lighting Light Sources
GB/T, 11499-2001 Semiconductor Discrete Devices Text Symbols
GB/T 15651-1995 Semiconductor Devices Discrete Devices and Integrated Circuits Part 5: Optoelectronic Devices CIEC 60747-5:1992, IDT)
CIE 127: 1997 Technical Report LED Measurement
ANSI/ESD STM 5.1: 2001~Electrostatic Discharge Sensitivity Test - Network Human Mode
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